Industrial Bobcat Series
The Bobcat and Bobcat+ cameras deliver cost-effective shortwave infrared imaging built around an in-house uncooled InGaAs detector. Compact, lightweight, and available in both CameraLink and GigE Vision interfaces, the Bobcat family is the trusted SWIR choice for laser beam analysis, sorting, recycling, and semiconductor defect inspection.
Cost-Effective SWIR Without Compromise
The Bobcat series by Exosens (Xenics) establishes the benchmark for affordable SWIR area-scan imaging. Built on an in-house developed uncooled InGaAs photodiode array with CTIA ROIC, every Bobcat camera delivers reliable shortwave infrared performance in a compact, lightweight package weighing as little as 280 g.
Bobcat 320 targets cost-sensitive volume markets with 320 × 256 resolution and up to 400 Hz frame rates. The Bobcat+ 320 extends this foundation to demanding applications and adds an optional vSWIR response into the visible spectrum. Bobcat 640 scales to 640 × 512 pixels with a VisNIR option for superior low-light sensitivity. The Bobcat Gated series adds an extremely short 100 ns integration time for time-gated imaging in laser illumination applications.
All models integrate seamlessly with Xeneth, Xenics's flagship software suite, dramatically reducing setup and R&D time.
- Uncooled InGaAs photodiode array with CTIA ROIC for stable, consistent imaging
- GigE Vision and CameraLink™ interface options for flexible system integration
- C-mount or M42 optical interface — compatible with a wide range of SWIR lenses
- Xeneth software included — rapid configuration, control, and image acquisition
- Optional filter holder for 25.4 mm filters in the C-mount adapter
- vSWIR and VisNIR options extend coverage into the visible spectrum
- 100 ns minimum integration time available in Bobcat Gated series
- CE and RoHS compliant — ready for global industrial deployment
Choose Your Bobcat Configuration
| Resolution | 320 × 256 px |
| Pixel Pitch | 20 µm |
| Spectral Range | 900–1700 nm |
| Max Frame Rate | 100 or 400 Hz |
| Interface | GigE or CameraLink |
| Power | 2.8 W or 4 W |
| Weight | 285 g or 334 g |
| Lens Mount | C-mount or M42 |
| Resolution | 320 × 256 px |
| Pixel Pitch | 20 µm |
| Spectral Range | 900–1700 nm |
| Max Frame Rate | 400 Hz |
| Interface | GigE Vision |
| Power | 4 W |
| Weight | 280 g |
| Lens Mount | C-mount or M42 |
| Resolution | 320 × 256 px |
| Pixel Pitch | 20 µm |
| Spectral Range | 900–1700 nm (+vSWIR opt.) |
| Max Frame Rate | 400 Hz |
| Interface | GigE Vision |
| Power | 4 W |
| Weight | 334 g |
| Lens Mount | C-mount or M42 |
| Resolution | 640 × 512 px |
| Pixel Pitch | 20 µm |
| Spectral Range | 900–1700 nm (+VisNIR to 400 nm) |
| Max Frame Rate | 100 Hz |
| Interface | CameraLink or USB3 Vision |
| Power | 2.8 W or 4 W |
| Weight | 285 g or 334 g |
| Lens Mount | C-mount or M42 |
| Resolution | 320 × 256 px |
| Pixel Pitch | 20 µm |
| Spectral Range | 900–1700 nm |
| Max Frame Rate | 400 Hz |
| Min Integration | 100 ns |
| Interface | CameraLink or GigE Vision |
| Lens Mount | C-mount or M42 |
Side-by-Side Comparison
| Specification | Bobcat 320 | Bobcat 320 TE0 & WL | Bobcat+ 320 | Bobcat 640 | Bobcat Gated |
|---|---|---|---|---|---|
| Detector | InGaAs CTIA ROIC | InGaAs CTIA ROIC | InGaAs CTIA ROIC | InGaAs CTIA ROIC | InGaAs CTIA ROIC |
| Resolution | 320 × 256 px | 320 × 256 px | 320 × 256 px | 640 × 512 px | 320 × 256 px |
| Pixel Pitch | 20 µm | 20 µm | 20 µm | 20 µm | 20 µm |
| Spectral Range | 900–1700 nm | 900–1700 nm | 900–1700 nm (+vSWIR) | 900–1700 nm (+VisNIR) | 900–1700 nm |
| Max Frame Rate | 100 or 400 Hz | 400 Hz | 400 Hz | 100 Hz | 400 Hz |
| Min Integration | — | — | — | — | 100 ns |
| Interface | GigE CameraLink | GigE | GigE | CameraLink USB3 | CameraLink GigE |
| Lens Mount | C-mount / M42 | C-mount / M42 | C-mount / M42 | C-mount / M42 | C-mount / M42 |
| Power | 2.8 W or 4 W | 4 W | 4 W | 2.8 W or 4 W | 2.8 W or 4 W |
| Weight | 285 g or 334 g | 280 g | 334 g | 285 g or 334 g | 285 g or 334 g |
| Compliance | CE, RoHS | CE, RoHS | CE, RoHS | CE, RoHS | CE, RoHS |
| Best For | Laser analysis, sorting, semiconductor inspection | Laser beam & wavefront sensing | Demanding applications, vSWIR imaging | High-detail inspection, low-light imaging | Pulsed laser, range-gated applications |
